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@Article{OliveiraLobMar:2012:InSiIn,
               author = "Oliveira, Deiler Antonio Lima and {Evaldo Jos{\'e} Corat} and 
                         {Vladimir Jesus Trava-Airoldi} and Lobo, Anderson Oliveira and 
                         Marciano, Fernanda Roberta",
          affiliation = "{} and {Instituto Nacional de Pesquisas Espaciais (INPE)} and 
                         {Instituto Nacional de Pesquisas Espaciais (INPE)} and 
                         {Universidade do Vale do Para{\'{\i}}ba - Univap} and 
                         {Universidade do Vale do Para{\'{\i}}ba - Univap}",
                title = "Influence of the silicon interlayer on diamond-like carbon films 
                         deposited on glass substrates",
              journal = "Revista UNIVAP",
                 year = "2012",
               volume = "18",
               number = "31",
                pages = "112 - 121",
             abstract = "Diamond-like carbon (DLC) films as a hard protective coating have 
                         achieved great success in a diversity of technological 
                         applications. However, adhesion of DLC films to substrates can 
                         restrict their applications. The influence of a silicon interlayer 
                         in order to improve DLC adhesion on glass substrates was 
                         investigated. Amorphous silicon interlayer and DLC films were 
                         deposited using plasma enhanced chemical vapor deposition from 
                         silane and methane, respectively. The bonding structure, 
                         transmittance, refraction index, and adherence of the films were 
                         also evaluated regarding the thickness of the silicon interlayer. 
                         Raman scattering spectroscopy did not show any substantial 
                         difference in DLC structure due to the interlayer thickness of the 
                         silicon. Optical measurements showed a sharp decrease of 
                         transmittance in the ultra-violet region caused by the fundamental 
                         absorption of the light. In addition, the absorption edge of 
                         transmittance shifted toward longer wavelength side in the 
                         ultra-violet region as the thickness of the silicon interlayer 
                         increased. The tribological results showed an increase of DLC 
                         adherence as the silicon interlayer increased, which was 
                         characterized by less cracks around the grooves.",
                 issn = "1517-3275",
             language = "en",
           targetfile = "50-483-1-PB.pdf",
        urlaccessdate = "23 jan. 2021"
}


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