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@Article{MorelhãoKyNeFoRaAb:2018:HyReMu,
               author = "Morelh{\~a}o, S{\'e}rgio L. and Kycia, Stefan and Netzke, Samuel 
                         and Fornari, Celso Israel and Rappl, Paulo Henrique de Oliveira 
                         and Abramof, Eduardo",
          affiliation = "{University of Guelph} and {University of Guelph} and {University 
                         of Guelph} and {Instituto Nacional de Pesquisas Espaciais (INPE)} 
                         and {Instituto Nacional de Pesquisas Espaciais (INPE)} and 
                         {Instituto Nacional de Pesquisas Espaciais (INPE)}",
                title = "Hybrid reflections from multiple x-ray scattering in epitaxial 
                         bismuth telluride topological insulator films",
              journal = "Applied Physics Letters",
                 year = "2018",
               volume = "112",
               number = "10",
                pages = "e101903",
                month = "Mar.",
             abstract = "Epitaxial films of bismuth telluride topological insulators have 
                         received increasing attention due to their potential applications 
                         in spintronic and quantum computation. One of the most important 
                         properties of epitaxial films is the presence of interface defects 
                         due to the lateral lattice mismatch since electrically active 
                         defects can drastically compromise device performance. By 
                         describing hybrid reflections in hexagonal bismuth telluride films 
                         on cubic substrates, in-plane lattice mismatches were 
                         characterized with accuracy at least 20 times better than using 
                         other X-ray diffraction methods, providing clear evidence of 
                         0.007% lateral lattice mismatch, consistent with stress relaxation 
                         associated with van der Waals gaps in the film structure.",
                  doi = "10.1063/1.5020375",
                  url = "http://dx.doi.org/10.1063/1.5020375",
                 issn = "0003-6951",
                label = "self-archiving-INPE-MCTIC-GOV-BR",
             language = "en",
           targetfile = "morelhao_hybrid.pdf",
        urlaccessdate = "29 nov. 2020"
}


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