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@InProceedings{MorelhãoNetForRapAbr:2018:AdXrDi,
               author = "Morelh{\~a}o, S{\'e}rgio L. and Netzke, Samuel and Fornari, 
                         Celso Israel and Rappl, Paulo Henrique de Oliveira and Abramof, 
                         Eduardo",
          affiliation = "{University of Guelph} and {University of Guelph} and {Instituto 
                         Nacional de Pesquisas Espaciais (INPE)} and {Instituto Nacional de 
                         Pesquisas Espaciais (INPE)} and {Instituto Nacional de Pesquisas 
                         Espaciais (INPE)}",
                title = "Advanced X-ray diffraction methods for van der Waals epitaxic 
                         films",
                 year = "2018",
         organization = "Encontro da Sociedade Brasileira de Pesquisa em Materiais 
                         (SBPMat), 17.",
  conference-location = "Natal, RN",
      conference-year = "16-20 set.",
             language = "en",
           targetfile = "Accepted abstract for presentation.pdf",
        urlaccessdate = "28 nov. 2020"
}


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