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@InProceedings{SeixasJrFSMMGAGFPZV:2015:FlEnEl,
               author = "Seixas Jr., Luis Fernando and Finco, Saulo and Silveira, Marcilei 
                         Gazelli and Manea, Silvio and Medina, Nilberto H. and Gimenez, 
                         Salvador and Added, Nemitalla and Gon{\c{c}}alez, Odair Lelis and 
                         Federico, Claudio and Pereira, Evaldo C. and Zampellin, Leonardo 
                         and Vaz, R. G.",
          affiliation = "{} and {} and {} and {Instituto Nacional de Pesquisas Espaciais 
                         (INPE)}",
                title = "Flexible environment electrical test of the radiation effects for 
                         semiconductor devices and integrated circuits in Brazil",
            booktitle = "Proceedings...",
                 year = "2015",
         organization = "Werice Aerospacial, 6.",
             keywords = "Automatic Test Equipment, Irradiations Test Facility.",
  conference-location = "S{\~a}o Jos{\'e} dos Campos, SP",
      conference-year = "3-5 Nov.",
                label = "lattes: 3678026099849524 4 SeixasJrFSMMGAGFPZV:2015:FlEnEl",
             language = "en",
               volume = "Unico",
        urlaccessdate = "03 dez. 2020"
}


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