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@InProceedings{ArmelinNaviDAmo:2018:PrAwFa,
               author = "Armelin, F{\'a}bio Batagin and Naviner, Lirida A. B. and D'Amore, 
                         Roberto",
          affiliation = "{Instituto Nacional de Pesquisas Espaciais (INPE)} and 
                         Tel{\'e}com ParisTech, COMELEC and {Instituto Tecnologico de 
                         Aeron{\'a}utica (ITA)}",
                title = "Probability aware fault-injection approach for SER estimation",
            booktitle = "Proceedings...",
                 year = "2018",
                pages = "1",
         organization = "IEEE LatinAmerican Test Symposium, 19. (LATS)",
            publisher = "IEEE",
             abstract = "The Soft-Error Rate (SER) estimation is used to predict how 
                         electronic systems will respond to the transient electrical pulses 
                         induced by the ionizing radiation. SER estimation by radiation 
                         test is an accurate method, but it is expensive and requires the 
                         real device. Traditional simulation methods incorporate logical, 
                         temporal and electrical masking effects while injecting faults at 
                         the output of the device's functional elements. Nevertheless, they 
                         do not consider the probability of the ionizing radiation to 
                         produce a transient fault at the output of each class of 
                         functional element. On the other hand, studies in the stochastic 
                         computing domain deal with a probabilistic fault-injection 
                         approach. Since many concomitant faults among the elements may 
                         occur, the fault probability of each element is treated 
                         independently. This leads to the use of one Pseudo-Random Number 
                         Generator (PRNG) and a probability comparator for each functional 
                         element. However, the analysis of a single fault is usually enough 
                         for SER estimation. In this context, this work presents a 
                         different approach for probability-aware fault-injection, in which 
                         a weighted distribution of faults is defined considering the 
                         relative fault probability of each functional element. This 
                         approach enables the use of just one PRNG and a decoder for the 
                         entire device, instead of a pair `PRNG-comparator' per element, 
                         leading to a significant reduction in logic blocks consumption. 
                         For the example analyzed in this study, the use of relative fault 
                         probability decreases the number of logic blocks from 875 
                         (adopting independent fault probability) to 495.",
  conference-location = "Sao Paulo, SP",
      conference-year = "12-14 mar.",
                  doi = "10.1109/LATW.2018.8349692",
                  url = "http://dx.doi.org/10.1109/LATW.2018.8349692",
                 isbn = "9781538614723",
                label = "lattes: 9537412416816656 1 ArmelinNaviDAmo:2018:PrAwFa",
             language = "en",
           targetfile = "armelin_probability.pdf",
        urlaccessdate = "27 nov. 2020"
}


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