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1 referência encontrada buscando em 17 dentre 17 Arquivos.
Data e hora local de busca: 07/02/2023 15:28.
1. Identificação
Tipo de ReferênciaArtigo em Evento (Conference Proceedings)
Código do Detentorisadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S
Repositó   (acesso restrito)
Última Atualização2013: (UTC) administrator
Repositório de
Última Atualização dos Metadados2018: (UTC) administrator
Chave de CitaçãoGuareschiAzKaReDuScDe:2013:CoTeBe
TítuloConfigurable test bed design for nanosats to qualify commercial and customized integrated circuits
Data de Acesso07 fev. 2023
Tipo SecundárioPRE CI
Número de Arquivos1
Tamanho455 KiB
2. Contextualização
Autor1 Guareschi, William
2 Azambuja, Jose
3 Kastensmidt, Fernanda
4 Reis, Ricardo
5 Durão, Otávio Santos Cupertino
6 Schuch, Nelson
7 Dessbesel, Gustavo
Identificador de Curriculo1
Afiliação1 UFRGS, PGMICRO, PPGC, Porto Alegre, RS, Brazil
2 UFRGS, PGMICRO, PPGC, Porto Alegre, RS, Brazil
3 UFRGS, PGMICRO, PPGC, Porto Alegre, RS, Brazil
4 UFRGS, PGMICRO, PPGC, Porto Alegre, RS, Brazil
5 Instituto Nacional de Pesquisas Espaciais (INPE)
6 Instituto Nacional de Pesquisas Espaciais (INPE)
Endereço de e-Mail do Autor1
Endereço de
Nome do EventoIEEE Aerospace Conference.
Localização do EventoBig Sky, Montana, USA
DataMar. 2 - 9, 2013
Título do LivroProceedings
Histórico (UTC)2013-07-11 16:24:38 :: -> administrator ::
2018-06-05 04:14:35 :: administrator -> :: 2013
3. Conteúdo e estrutura
É a matriz ou uma cópia?é a matriz
Estágio do Conteúdoconcluido
Tipo do ConteúdoExternal Contribution
Tipo de Versãopublisher
Palavras-Chaveadaptive systems
computer hardware description languages
control systems
data transfer
equipment testing
flash memory
flight control systems
integrated circuits
ionizing radiation
network protocols
ResumoThe use of small satellites has increased substantially in recent years due to the reduced cost of their development and launch, as well to the flexibility offered by commercial components. The test bed is a platform that allows components to be evaluated and tested in space. It is a flexible platform, which can be adjusted to a wide quantity of components and interfaces. This work proposes the design and implementation of a test bed suitable for test and evaluation of commercial circuits used in nanosatellites. The development of such a platform allows developers to reduce the efforts in the integration of components and therefore speed up the overall system development time. The proposed test bed is a configurable platform implemented using a Field Programmable Gate Array (FPGA) that controls the communication protocols and connections to the devices under test. The Flash-based ProASIC3E FPGA from Microsemi is used as a control system. This adaptive system enables the control of new payloads and softcores for test and validation in space. Thus, the integration can be easily performed through configuration parameters. It is intended for modularity. Each component connected to the test bed can have a specific interface programmed using a hardware description language (HDL). The data of each component is stored in embedded memories. Each component has its own memory space. The size of the allocated memory can be also configured. The data transfer priority can be set and packaging can be added to the logic, when needed. Communication with peripheral devices and with the Onboard Computer (OBC) is done through the pre-implemented protocols, such as I2C (Inter-Integrated Circuit), SPI (Serial Peripheral Interface) and external memory control. In loco primary tests demonstrated the control system's functionality. The commercial ProASIC3E FPGA family is not space-flight qualified, but tests have been made under Total Ionizing Dose (TID) showing its robustness up to 25 krads (Si). When considering proton and heavy ions, flash-based FPGAs provide immunity to configuration loss and low bit-flips susceptibility in flash memory. In this first version of the test bed two components are connected to the controller FPGA: a commercial magnetometer and a hardened test chip. The embedded FPGA implements a Single Event Effects (SEE) hardened microprocessor and few other soft-cores to be used in space. This test bed will be used in the NanoSatC-BR1, the first Brazilian Cubesat scheduled to be launched in mid-2013.
Arranjo > BDMCI > Fonds > Produção anterior à 2021 > CRCRS > Configurable test bed...
Arranjo > BDMCI > Fonds > Produção anterior à 2021 > COGCT > Configurable test bed...
Conteúdo da Pasta docacessar
Conteúdo da Pasta sourcenão têm arquivos
Conteúdo da Pasta agreement
agreement.html 11/07/2013 13:24 1.0 KiB 
4. Condições de acesso e uso
Arquivo Alvo06497170.pdf
Grupo de Usuáriosadministrator
Grupo de Leitoresadministrator
Permissão de Leituradeny from all and allow from 150.163
Permissão de Atualizaçãonão transferida
5. Fontes relacionadas
Unidades Imediatamente Superiores8JMKD3MGPCW/3EUFCFP
6. Notas
Notas2013 IEEE Aerospace Conference, AERO 2013, March 2, 2013 - March 9, 2013
Campos Vaziosarchivingpolicy archivist callnumber copyholder copyright creatorhistory descriptionlevel dissemination edition editor format issn label lineage mark nextedition numberofvolumes orcid organization pages parameterlist parentrepositories previousedition previouslowerunit progress project publisher publisheraddress rightsholder secondarydate secondarykey secondarymark serieseditor session shorttitle sponsor subject tertiarymark tertiarytype type url volume
7. Controle da descrição
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