@Article{BaroniRSPRRAPV:2006:MoGrPa,
               author = "Baroni, M. P. M. A. and Rosa, Reinaldo Roberto and Silva, A. 
                         Ferreira and Pepe, I. and Roman, L. S. and Ramos, Fernando Manuel 
                         and Ahuja, R. and Persson, C. and Veje, E.",
          affiliation = "Instituto Nacional de Pesquisas Espaciais, Laboratorio Associado 
                         de Computa{\c{c}}{\~a}o e Matem{\'a}tica Aplicada (INPE.LAC) 
                         and Instituto Nacional de Pesquisas Espaciais, Laboratorio 
                         Associado de Computa{\c{c}}{\~a}o e Matem{\'a}tica Aplicada 
                         (INPE.LAC) and Grupo de Fisica Basica e Aplicada em Materiais 
                         Semicondutores, Laboratorio de Propriedades Opticas, Instituto de 
                         Fisica, Universidade Federal da Bahia and Grupo de Fisica Basica e 
                         Aplicada em Materiais Semicondutores, Laboratorio de Propriedades 
                         Opticas, Instituto de Fisica, Universidade Federal da Bahia and 
                         Grupo de Dispositivos Nanoestruturados, Departamento de 
                         F{\'{\i}}sica, Universidade Federal do Paran{\'a} and Instituto 
                         Nacional de Pesquisas Espaciais, Laboratorio Associado de 
                         Computa{\c{c}}{\~a}o e Matem{\'a}tica Aplicada (INPE.LAC) and 
                         Department of Physics, Condensed Matter Theory Group, Uppsala 
                         University and Applied Materials Physics, Department of Materials 
                         Science and Engineering, Royal Institute of Technology and Grupo 
                         de Fisica Basica e Aplicada em Materiais Semicondutores, 
                         Laboratorio de Propriedades Opticas, Instituto de Fisica, 
                         Universidade Federal da Bahia",
                title = "Modeling and gradient pattern analysis of irregular SFM structures 
                         of porous silicon",
              journal = "Microelectronics Journal",
                 year = "2006",
               volume = "37",
               number = "4",
                pages = "290--294",
                month = "Apr.",
             keywords = "porous silicon, KPZ equation, gradient pattern analysis, 
                         nanostructures, ASYMMETRIC FRAGMENTATION PATTERNS, DYNAMICS.",
             abstract = "Technological applications in opto-electronic devices have 
                         increased the interest in characterizing porous silicon structure 
                         patterns. Due to its physical properties, solutions from KPZ 2D 
                         are adopted to simulate the structure of porous material interface 
                         whose spatial characteristics are equivalent to those found in 
                         porous silicon samples. The analysis of the simulated and real 
                         scanning Force Microscopy (SFM) surfaces was done using the 
                         Gradient Pattern Analysis (GPA). We found that the KPZ 2D model 
                         presented asymmetry levels compatible with the irregular surfaces 
                         observed by means of SFM images of pi-Si.",
           copyholder = "SID/SCD",
                 issn = "0026-2692",
             language = "en",
           targetfile = "Modeling and gradient pattern analysis of irregular.pdf",
        urlaccessdate = "15 jun. 2024"
}