@Article{FerrDottKlei:2001:FrDiBo,
author = "da, Silva Leide Lili Gon{\c{c}}alves and Ferreira, Neidenei Gomes
and Dotto, MER. and Kleinke, MU.",
affiliation = "Instituto Nacional de Pesquisas Espaciais, Laborat{\'o}rio
Associado de Sensores e Materiais (INPE.LAS) and Instituto
Nacional de Pesquisas Espaciais, Laborat{\'o}rio Associado de
Sensores e Materiais (INPE.LAS) and {NanoStructures and Interfaces
Laboratory} and {NanoStructures and Interfaces Laboratory}",
title = "The fractal dimension of boron-doped diamond films",
journal = "Applied Surface Science",
year = "2001",
volume = "181",
number = "3-4",
pages = "327--330",
month = "Sept.",
keywords = "SENSORS AND MATERIALS, Boron-doped diamond films, AFM, Cyclic
voltammetry, Fractal dimension, SENSORES E MATERIAIS, Filmes de
diamante, Voltametria c{\'{\i}}clica, Dimens{\~a}o.",
abstract = "Boron-doped diamond films were grown by ilament-assisted chemical
vapor deposition (CVD). The fractal dimension (FD) of these films
was investigated by atomic force microscope and cyclic
voltammetry. The scaling behavior is measured for peak current in
cyclic voltammetry, height-height correlations and island size
distribution in AFM images. Cyclic voltammetry experiments and the
mass-radius (or island distribution) analysis have evidenced FD
values lower than two suggesting non-contiguous chemically active
sites.",
copyholder = "SID/SCD",
isbn/issn = "0169-4332",
issn = "0169-4332",
language = "en",
targetfile = "fractal dimension.pdf",
urlaccessdate = "16 jun. 2024"
}