@InProceedings{PereiraSantMane:2017:CoViPr,
author = "Pereira, Viny Cesar and Santiago J{\'u}nior, Valdivino Alexandre
de and Manea, Silvio",
affiliation = "{Instituto Nacional de Pesquisas Espaciais (INPE)} and {Instituto
Nacional de Pesquisas Espaciais (INPE)} and {Instituto Nacional de
Pesquisas Espaciais (INPE)}",
title = "SEU mitigation for SRAM FPGAs: a comparison via probabilistic
model checking",
booktitle = "Anais...",
year = "2017",
pages = "56--69",
organization = "Simp{\'o}sio Brasileiro de Redes de Computadores e Sistemas
Distribu{\'{\i}}dos",
abstract = "Although there are several Single-Event Upset (SEU) mitigation
techniques for SRAM-based Field Programmable Gate Arrays (FPGAs),
comparisons are still necessary regarding dependability analyzes
of these techniques. Most of these assessments analyze the
techniques after design and implementation in FPGA which may be
too costly. Stochastic/Probabilistic analysis allow to obtain
results in the early stages of design. In this paper, we compare
three of these strategies, Scrubbing, Triple Modular Redundancy
(TMR), and Hamming code, via Probabilistic Model Checking. Results
show that TMR allows upsets to accumulate and must be combined
with Error Correction Codes (ECCs), such as Hamming, and that the
Scrubbing interval directly affects reliability while safety is
more related to the coverage rate.",
conference-location = "Bel{\'e}m, PA",
conference-year = "15-19 maio",
language = "en",
targetfile = "pereira_seu.pdf",
urlaccessdate = "29 mar. 2024"
}