@ElectronicSource{MorelhãoKyNeFoRaAb::HyReMu,
             abstract = "Epitaxial films of bismuth telluride topological insulators have 
                         received increasing attention due to potential applications in 
                         spintronic and quantum computation. One of the most important 
                         properties of epitaxial films is the presence of interface defects 
                         due to lateral lattice mismatch since electrically active defects 
                         can drastically compromise device performance. By describing 
                         hybrid reflections in hexagonal bismuth telluride films on cubic 
                         substrates, in-plane lattice mismatches were characterized with 
                         accuracy at least 20 times better than using other X-ray 
                         diffraction methods, providing clear evidence of 0.007% lateral 
                         lattice mismatch, consistent with stress relaxation associated 
                         with van der Waals gaps in the film structure.",
              address = "S{\~a}o Jos{\'e} dos Campos",
          affiliation = "{University of Guelph} and {University of Guelph} and {University 
                         of Guelph} and {Instituto Nacional de Pesquisas Espaciais (INPE)} 
                         and {Instituto Nacional de Pesquisas Espaciais (INPE)} and 
                         {Instituto Nacional de Pesquisas Espaciais (INPE)}",
               author = "Morelh{\~a}o, S{\'e}rgio L. and Kycia, Stefan and Netzke, Samuel 
                         and Fornari, Celso Israel and Rappl, Paulo Henrique de Oliveira 
                         and Abramof, Eduardo",
             keywords = "epitaxial films, bismuth telluride topological insulator.",
             language = "en",
       lastupdatedate = "2018-03-13",
            publisher = "Instituto and Nacional and de and Pesquisas and Espaciais",
                  ibi = "8JMKD3MGP3W34R/3QM2BUH",
                  url = "http://urlib.net/ibi/8JMKD3MGP3W34R/3QM2BUH",
           targetfile = "v1.pdf",
                title = "Hybrid reflections from multiple x-ray scattering in epitaxial 
                         bismuth telluride topological insulator films",
         typeofmedium = "On-line",
        urlaccessdate = "23 abr. 2024"
}