@Article{ArmelinNaviAmor:2019:SoVuEs,
author = "Armelin, F{\'a}bio Batagin and Naviner, L{\'{\i}}rida Alves de
Barros and d'Amore, Roberto",
affiliation = "{Instituto Nacional de Pesquisas Espaciais (INPE)} and {Institut
Polytechnique de Paris} and {Instituto Tecnol{\'o}gico de
Aeron{\'a}utica (ITA)}",
title = "Soft-error vulnerability estimation approach based on the set
susceptibility of each gate",
journal = "Electronics (Switzerland)",
year = "2019",
volume = "8",
number = "7",
pages = "e749",
month = "July",
keywords = "Soft-Error, Single-Event Effect, Single-Event Transient,
Soft-Error Rate, Soft-Error Vulnerability.",
abstract = "Soft-Error Vulnerability (SEV) is a parameter used to evaluate the
robustness of a circuit to the induced Soft Errors (SEs). There
are many techniques for SEV estimation, including analytical,
electrical and logic simulations, and emulation-based approaches.
Each of them has advantages and disadvantages regarding estimation
time, resources consumption, accuracy, and restrictions over the
analysed circuit. Concerning the ionising radiation effects, some
analytical and electrical simulation approaches take into account
how the circuit topology and the applied input patterns affect
their susceptibilities to Single Event Transient (SET) at the gate
level. On the other hand, logic simulation and emulation
techniques usually ignore these SET susceptibilities. In this
context, we propose a logic simulation-based probability-aware
approach for SEV estimation that takes into account the specific
SET susceptibility of each circuit gate. For a given operational
scenario, we extract the input patterns applied to each gate and
calculate its specific SET susceptibility. For the 38 analysed
benchmark circuits, we obtained a reduction from 15.27% to 0.68%
in the average SEV estimation error, when comparing the estimated
value to a reference obtained at the transistor level. The results
point out an improvement of the SEV estimation process by
considering the specific SET susceptibilities.",
doi = "10.3390/electronics8070749",
url = "http://dx.doi.org/10.3390/electronics8070749",
issn = "1450-5843",
language = "en",
targetfile = "armelin_soft.pdf",
urlaccessdate = "20 set. 2024"
}