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		<title>Uma discussão sobre combinar análises da física da falha e até dados de campo a métodos tradicionais para melhorar as predições da confiabilidade de equipamentos eletrônicos</title>
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		<year>2019</year>
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		<author>Santos, Carlos Eduardo da Silva,</author>
		<author>Maia, Graziela Fernanda de Souza,</author>
		<author>Souza, Marcelo Lopes de Oliveira e,</author>
		<author>Rabello, Ana Paula de Sá Santos,</author>
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		<conferencename>Congresso e Mostra Internacionais SAE BRASIL de Tecnologia da Mobilidade, 28</conferencename>
		<conferencelocation>São Paulo, SP</conferencelocation>
		<date>15-17 out.</date>
		<volume>25</volume>
		<booktitle>Anais</booktitle>
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