| 1. Identity statement | |
| Reference Type | Journal Article |
| Site | plutao.sid.inpe.br |
| Holder Code | isadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S |
| Identifier | J8LNKAN8RW/39RQ9F3 |
| Repository | dpi.inpe.br/plutao/2011/06.11.02.34.22 (restricted access) |
| Last Update | 2011:10.20.11.51.15 (UTC) administrator |
| Metadata Repository | dpi.inpe.br/plutao/2011/06.11.02.34.23 |
| Metadata Last Update | 2018:06.05.00.01.16 (UTC) administrator |
| Secondary Key | INPE--PRE/ |
| DOI | 10.1088/0022-3727/44/18/185405 |
| ISSN | 1434-6060 |
| Label | lattes: 3801575713681461 3 SuelaAbRaFrClBo:2011:InSuPr |
| Citation Key | SuelaAbRaFrClBo:2011:InSuPr |
| Title | Investigation of the surface properties of CaF layers on (1?1?1) Si as a function of growth temperature  |
| Year | 2011 |
| Month | May |
| Access Date | 2024, May 04 |
| Secondary Type | PRE PI |
| Number of Files | 1 |
| Size | 1738 KiB |
| 2. Context | |
| Author | 1 Suela, Jefferson 2 Abramof, Eduardo 3 Rappl, Paulo Henrique de Oliveira 4 Freitas, F E 5 Closs, H 6 Boschetti, Cesar |
| Resume Identifier | 1 2 8JMKD3MGP5W/3C9JGUH 3 8JMKD3MGP5W/3C9JJ37 4 5 6 8JMKD3MGP5W/3C9JGRJ |
| Group | 1 LAP-CTE-INPE-MCT-BR 2 CTE-CTE-INPE-MCT-BR 3 LAS-CTE-INPE-MCT-BR 4 LAP-CTE-INPE-MCT-BR 5 LAS-CTE-INPE-MCT-BR 6 LAS-CTE-INPE-MCT-BR |
| Affiliation | 1 Instituto Nacional de Pesquisas Espaciais (INPE) 2 Instituto Nacional de Pesquisas Espaciais (INPE) 3 Instituto Nacional de Pesquisas Espaciais (INPE) 4 Instituto Nacional de Pesquisas Espaciais (INPE) 5 Instituto Nacional de Pesquisas Espaciais (INPE) 6 Instituto Nacional de Pesquisas Espaciais (INPE) |
| Author e-Mail Address | 1 jeffersonsuela@yahoo.com.br 2 3 rappl@las.inpe.br |
| e-Mail Address | rappl@las.inpe.br |
| Journal | Journal of Physics D: Applied Physics |
| Volume | 44 |
| Number | 18 |
| Pages | 185405 |
| Secondary Mark | B1_ASTRONOMIA_/_FÍSICA B2_BIOTECNOLOGIA B2_CIÊNCIAS_BIOLÓGICAS_II B2_CIÊNCIAS_BIOLÓGICAS_III A2_ECOLOGIA_E_MEIO_AMBIENTE A2_ENGENHARIAS_II A2_ENGENHARIAS_III B1_ENGENHARIAS_IV C_ENSINO_DE_CIÊNCIAS_E_MATEMATICA A1_INTERDISCIPLINAR A1_MATERIAIS B1_QUÍMICA |
| History (UTC) | 2011-06-11 17:43:42 :: lattes -> marciana :: 2011 2011-10-20 11:51:15 :: marciana -> administrator :: 2011 2012-07-25 15:50:03 :: administrator -> banon :: 2011 2012-09-27 17:46:40 :: banon -> administrator :: 2011 2018-06-05 00:01:16 :: administrator -> marciana :: 2011 |
| 3. Content and structure | |
| Is the master or a copy? | is the master |
| Content Stage | completed |
| Transferable | 1 |
| Content Type | External Contribution |
| Version Type | publisher |
| Keywords | RESONANT-TUNNELING DIODE FLUORIDE BUFFER LAYERS EPITAXIAL-GROWTH ELECTRICAL-PROPERTIES SENSOR ARRAYS SI(111) SILICON CAF2/SI(111) HETEROEPITAXY LATTICE |
| Abstract | This work reports on the study of surface properties of CaF(2) films (30 and 10 nm thick) grown on (1 1 1) Si by molecular beam epitaxy at substrate temperatures from 400 to 700 degrees C. Reflection high-energy electron diffraction (RHEED) analysis indicated that CaF(2) films with smooth surfaces were obtained in temperature ranges 500-550 degrees C and 620-700 degrees C, while at temperatures from 400 to 500 degrees C and in the vicinity of 600 degrees C the films showed grains randomly oriented on top of the surface. Atomic force microscopy (AFM) investigation corroborated with the RHEED results and confirmed the presence of grains on the film surface, with an evident transition near 600 degrees C. The dependence of grain density on the growth temperature followed the expectation from the RHEED analysis. The arithmetical average roughness of the CaF(2) surface obtained from the AFM images remained below 1 nm for the best quality films. The x-ray reflectivity curves of all samples exhibited well-defined interference fringes, whose oscillation damping behaviour agreed with the RHEED and AFM results. The CaF(2) layer thickness and roughness were accurately determined by a best-fit procedure applied to the x-ray reflectivity data. By combining all results, the temperature range between 525 and 550 degrees C was found to be the most suitable to grow CaF(2) layers on (1 1 1) Si. For growth temperatures above 650 degrees C, pinholes and cracks started to reduce the CaF(2) surface quality. |
| Area | FISMAT |
| Arrangement 1 | urlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAS > Investigation of the... |
| Arrangement 2 | urlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAP > Investigation of the... |
| Arrangement 3 | urlib.net > BDMCI > Fonds > Produção anterior à 2021 > COCTE > Investigation of the... |
| doc Directory Content | access |
| source Directory Content | there are no files |
| agreement Directory Content | there are no files |
| 4. Conditions of access and use | |
| Language | en |
| Target File | 0022-3727_44_18_185405.pdf |
| User Group | administrator banon lattes marciana |
| Visibility | shown |
| Archiving Policy | denypublisher denyfinaldraft12 |
| Read Permission | deny from all and allow from 150.163 |
| Update Permission | not transferred |
| 5. Allied materials | |
| Next Higher Units | 8JMKD3MGPCW/3ESR3H2 8JMKD3MGPCW/3ET2RFS 8JMKD3MGPCW/3ET76KE |
| Dissemination | WEBSCI; PORTALCAPES. |
| Host Collection | dpi.inpe.br/plutao@80/2008/08.19.15.01 |
| 6. Notes | |
| Notes | Setores de Atividade: Atividades profissionais, científicas e técnicas, Pesquisa e desenvolvimento científico. |
| Empty Fields | alternatejournal archivist callnumber copyholder copyright creatorhistory descriptionlevel format isbn lineage mark mirrorrepository nextedition orcid parameterlist parentrepositories previousedition previouslowerunit progress project readergroup rightsholder schedulinginformation secondarydate session shorttitle sponsor subject tertiarymark tertiarytype typeofwork url |
| 7. Description control | |
| e-Mail (login) | marciana |
| update | |