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1. Identity statement
Reference TypeJournal Article
Sitemarte3.sid.inpe.br
Holder Codeisadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S
Identifier6qtX3pFwXQZ3r59YCT/H3Lwm
Repositorysid.inpe.br/iris@1905/2005/08.04.03.21   (restricted access)
Last Update2006:03.03.18.08.00 (UTC) administrator
Metadata Repositorysid.inpe.br/iris@1905/2005/08.04.03.22.01
Metadata Last Update2018:06.06.03.55.46 (UTC) administrator
Secondary KeyINPE-13567-PRE/8777
ISSN0103-9733
Label10547
Citation KeyHanamotoHeTrSoYaAb:2002:InLaIm
TitleInterfacial layers and impurity segregation in InP/In0.53Ga0.47As superlattices
ProjectTECMAT: Tecnologia de Materiais
Year2002
Secondary Date20020912
MonthJune
Access Date2024, Apr. 27
Secondary TypePRE PN
Number of Files1
Size293 KiB
2. Context
Author1 Hanamoto, L. K.
2 Henriques, A. B.
3 Tribuzy, C. V. B.
4 Souza, P. L.
5 Yavich, B.
6 Abramof, Eduardo
Group1
2
3
4
5
6 LAS-INPE-MCT-BR
Affiliation1 Universidade de São Paulo, Instituto de Física (USP)
2 Universidade de São Paulo, Instituto de Física (USP)
3 Pontifícia Universidade Católica, Centro de Estudos em Telecomunicações (PUC)
4 Pontifícia Universidade Católica, Centro de Estudos em Telecomunicações (PUC)
5 Pontifícia Universidade Católica, Centro de Estudos em Telecomunicações (PUC)
6 Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais, (INPE. LAS)
JournalBrazilian Journal of Physics
Volume32
Number2
Pages334-337
History (UTC)2005-08-04 03:22:02 :: administrator -> jefferson ::
2006-03-03 18:08:46 :: jefferson -> administrator ::
2006-11-14 18:52:54 :: administrator -> jefferson ::
2008-03-14 18:07:56 :: jefferson -> administrator ::
2018-06-06 03:55:46 :: administrator -> marciana :: 2002
3. Content and structure
Is the master or a copy?is the master
Content Stagecompleted
Transferable1
Content TypeExternal Contribution
KeywordsSENSORS AND MATERIALS
Impurity
Quantum wells
Photoluminescence
Growth
MOVPE
INP
SENSORES E MATERIAIS
Impurezas
Fotoluminescência
AbstractThe interfaces in InP/In0.53Ga0.47As superlattices modulation doped with Si were investigated using magneto-transport, capacitance-voltage, and high resolution X-ray diffraction measurements. Results indicate that a thick interfacial layer is formed when InP is grown on top of InxGa1-xAs, and that Si atoms that fall in the interfacial layer have a high probability of not forming a shallow donor center. Using a simple theoretical model the width of the interfacial layer which was estimated to be 7 +/- 1 monolayers.
AreaFISMAT
Arrangementurlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAS > Interfacial layers and...
doc Directory Contentaccess
source Directory Contentthere are no files
agreement Directory Contentthere are no files
4. Conditions of access and use
Languageen
Target File19.pdf
User Groupadministrator
jefferson
Visibilityshown
Copy HolderSID/SCD
Archiving Policydenypublisher denyfinaldraft12
Read Permissiondeny from all and allow from 150.163
5. Allied materials
Next Higher Units8JMKD3MGPCW/3ESR3H2
DisseminationWEBSCI; PORTALCAPES; SCIELO.
Host Collectionsid.inpe.br/banon/2001/04.03.15.36
6. Notes
Empty Fieldsalternatejournal archivist callnumber copyright creatorhistory descriptionlevel documentstage doi e-mailaddress electronicmailaddress format isbn lineage mark mirrorrepository nextedition notes orcid parameterlist parentrepositories previousedition previouslowerunit progress readergroup resumeid rightsholder schedulinginformation secondarymark session shorttitle sponsor subject tertiarymark tertiarytype typeofwork url versiontype
7. Description control
e-Mail (login)marciana
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