1. Identity statement | |
Reference Type | Journal Article |
Site | mtc-m16.sid.inpe.br |
Holder Code | isadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S |
Identifier | 6qtX3pFwXQZsFDuKxG/Cxjvk |
Repository | sid.inpe.br/marciana/2004/06.22.15.20 (restricted access) |
Last Update | 2008:04.01.12.50.41 (UTC) administrator |
Metadata Repository | sid.inpe.br/marciana/2004/06.22.15.20.43 |
Metadata Last Update | 2018:06.05.01.20.53 (UTC) administrator |
Secondary Key | INPE-10743-PRE/6202 |
ISBN/ISSN | 0925-9635 |
ISSN | 0925-9635 |
Citation Key | GonçalvesSandIha:2002:ChBoDo |
Title | Characterization of boron doped CVD diamond films by Raman spectroscopy and X-ray diffractometry |
Project | Tecnologia de plasma: Propulsão eletrostática |
Year | 2002 |
Month | Aug. |
Access Date | 2024, Apr. 28 |
Secondary Type | PRE PI |
Number of Files | 1 |
Size | 499 KiB |
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2. Context | |
Author | 1 Gonçalves, José Américo Neves 2 Sandonato, Gilberto Marrega 3 Iha, K. |
Resume Identifier | 1 8JMKD3MGP5W/3C9JHFN 2 8JMKD3MGP5W/3C9JHBA |
Group | 1 LAP-INPE-MCT-BR 2 LAP-INPE-MCT-BR |
Affiliation | 1 Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Plasma (INPE.LAP) 2 Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Plasma (INPE.LAP) 3 Instituto Tecnológico de Aeronáutica, Divisão de química (ITA) |
Author e-Mail Address | 1 americo@plasma.inpe.br |
Journal | Diamond and Related Materials |
Volume | 11 |
Number | 8 |
Pages | 1578-1583 |
History (UTC) | 2005-03-17 17:56:35 :: marciana -> administrator :: 2006-09-28 22:25:48 :: administrator -> marciana :: 2008-04-01 12:50:41 :: marciana -> administrator :: 2018-06-05 01:20:53 :: administrator -> marciana :: 2002 |
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3. Content and structure | |
Is the master or a copy? | is the master |
Content Stage | completed |
Transferable | 1 |
Content Type | External Contribution |
Keywords | PLASMA Diamond films X-ray diffractometry Raman spectroscopy Lattice parameter PLASMA Filmes de diamante Raio-x Difractometria Espectroscopia Raman |
Abstract | Boron doped diamond films grown by chemical vapor deposition on silicon (1 1 1) were measured by Raman spectroscopy and X-ray diffractometry to investigate the crystallographic direction and the lattice parameters of both the bSiC and diamond films with different levels of dopant. It was observed that the level of dopant has a significant influence on the lattice parameters for a boronycarbon ratio of 20 000 ppm, and also that the expansion of the lattice parameters was due to compressive thermal stress of diamond films. |
Area | FISPLASMA |
Arrangement | urlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAP > Characterization of boron... |
doc Directory Content | access |
source Directory Content | there are no files |
agreement Directory Content | there are no files |
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4. Conditions of access and use | |
Language | en |
Target File | characterization.pdf |
User Group | administrator marciana |
Visibility | shown |
Copy Holder | SID/SCD |
Archiving Policy | denypublisher denyfinaldraft24 |
Read Permission | deny from all and allow from 150.163 |
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5. Allied materials | |
Next Higher Units | 8JMKD3MGPCW/3ET2RFS |
Dissemination | WEBSCI; PORTALCAPES; COMPENDEX. |
Host Collection | sid.inpe.br/banon/2003/08.15.17.40 |
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6. Notes | |
Empty Fields | alternatejournal archivist callnumber copyright creatorhistory descriptionlevel documentstage doi e-mailaddress format isbn label lineage mark mirrorrepository nextedition notes orcid parameterlist parentrepositories previousedition previouslowerunit progress readergroup rightsholder schedulinginformation secondarydate secondarymark session shorttitle sponsor subject tertiarymark tertiarytype typeofwork url versiontype |
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7. Description control | |
e-Mail (login) | marciana |
update | |
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