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1. Identity statement
Reference TypeJournal Article
Sitemtc-m16.sid.inpe.br
Holder Codeisadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S
Identifier6qtX3pFwXQZsFDuKxG/CPoQL
Repositorysid.inpe.br/marciana/2004/07.20.08.25   (restricted access)
Last Update2004:07.20.03.00.00 (UTC) administrator
Metadata Repositorysid.inpe.br/marciana/2004/07.20.08.25.27
Metadata Last Update2018:06.05.01.20.57 (UTC) administrator
Secondary KeyINPE-10998-PRE/6454
ISSN1386-9477
Citation KeyAbramofRappUeta:2004:HiXrDi
TitleHigh-resolution x-ray diffraction analysis of SnTe/Sn1xEuxTe superlattices grown on (111) BaF2 substrates
Year2004
MonthJan.
Access Date2024, Apr. 27
Secondary TypePRE PI
Number of Files1
Size524 KiB
2. Context
Author1 Abramof, Eduardo
2 Rappl, Paulo Henrique de Oliveira
3 Ueta, Antonio Yukio
Resume Identifier1 8JMKD3MGP5W/3C9JGUH
2 8JMKD3MGP5W/3C9JJ37
3 8JMKD3MGP5W/3C9JGJU
Group1 LAS-INPE-MCT-BR
JournalPhysica E: Low-Dimensional Systems and Nanostructures
Volume20
Number3-4
Pages462-465
History (UTC)2008-06-10 22:27:32 :: administrator -> banon ::
2008-11-06 18:30:56 :: banon -> marciana ::
2008-11-06 18:32:54 :: marciana -> administrator ::
2018-06-05 01:20:57 :: administrator -> marciana :: 2004
3. Content and structure
Is the master or a copy?is the master
Content Stagecompleted
Transferable1
Content TypeExternal Contribution
KeywordsIV VI compounds
molecular beam epitaxy
superlattices
X-ray diffraction
AbstractA set of SnTe=Sn1−xEuxTe superlattice (SL) samples with increasing nominal Eu content x up to 0.28 was successfully grownon(1 1 1) BaF2 substrates by molecular beam epitaxy. A complete structural characterizationwas performed by triple-axis X-ray di#ractometry and reciprocal space mapping. The X-ray results showed that, despite the phase separation that normally occurs for unstrained Sn1−xEuxTe layers with x¿0:02, an SL stack with homogeneous individual layers can be formed for SL samples with a nominal Eu content up to 0.16. No SL satellite peak structure could be identi7ed for samples with x values higher than 0.24. The structural parameters of the individual layers that compose the SL were determined using a best-7t simulationprocedure which compared the calculated X-ray spectra to the measured (2 2 2) !=2 scans. The strain information used in the simulation was obtained from the reciprocal space maps measured around the (2 2 4) lattice point.
AreaFISMAT
Arrangementurlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAS > High-resolution x-ray diffraction...
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4. Conditions of access and use
Languageen
Target Fileabramof1.pdf
User Groupadministrator
banon
marciana
Visibilityshown
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Archiving Policydenypublisher denyfinaldraft24
Read Permissiondeny from all and allow from 150.163
5. Allied materials
Next Higher Units8JMKD3MGPCW/3ESR3H2
DisseminationWEBSCI; PORTALCAPES.
Host Collectionsid.inpe.br/banon/2003/08.15.17.40
6. Notes
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7. Description control
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