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1. Identity statement
Reference TypeJournal Article
Sitemtc-m16.sid.inpe.br
Holder Codeisadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S
Identifier6qtX3pFwXQZsFDuKxG/DpxcT
Repositorysid.inpe.br/marciana/2004/09.08.14.11   (restricted access)
Last Update2004:09.08.03.00.00 (UTC) administrator
Metadata Repositorysid.inpe.br/marciana/2004/09.08.14.11.18
Metadata Last Update2021:07.28.21.26.30 (UTC) administrator
Secondary KeyINPE-11266-PRE/6708
ISBN/ISSN0038-1098
ISSN0038-1098
Citation KeyFerreiradaSilvaRosRomVejPep:2000:ChAsFr
TitleCharacterization of asymmetric fragmentation patterns in SFM images of porous silicon
ProjectCélulas Solares (CELSOL): Desenvolvimento de técncias para obtenção de silício poroso
Year2000
MonthFeb.
Access Date2024, Apr. 28
Secondary TypePRE PI
Number of Files1
Size301 KiB
2. Context
Author1 Ferreira da Silva, A.
2 Rosa, Reinaldo Roberto
3 Roman, L. S.
4 Veje, E.
5 Pepe, I.
Resume Identifier1
2 8JMKD3MGP5W/3C9JJ5D
Group1 LAS-INPE-MCT-BR
Affiliation1 Instituto Nacional de Pesquisas Espaciais. Laboratório Associado de Sensores e Materiais (INPE.LAS)
2 Instituto Nacional de Pesquisas Espaciais. Laboratório Associado de Matemática e Computação Aplicada (INPE.LAC)
3 Laboratoy of Applied Physics, Linkoping University
4 Oersted Laboratory, Niels Bohr Institute, Universitetsparken
5 Universidade Federal da Bahia, Laboratório de Propriedades Ópticas, Instituto de Física (UFBA)
Author e-Mail Address1 ferreira@las.inpe.br
JournalSolid State Communication
Volume113
Number12
Pages703-708
History (UTC)2006-09-28 22:26:01 :: administrator -> sergio ::
2008-01-07 12:53:24 :: sergio -> marciana ::
2008-01-15 12:36:57 :: marciana -> administrator ::
2021-07-28 21:26:30 :: administrator -> marciana :: 2000
3. Content and structure
Is the master or a copy?is the master
Content Stagecompleted
Transferable1
Content TypeExternal Contribution
KeywordsMATERIALS AND SENSOR
Semiconductors
Nanofabrications
Crystal structure and symmetry
Optical properties
Band-Gap energy
Si
Photoluminescence
Heterojunction
Luminescence
Emission
Offsets
Porous siliconMATERIAIS E SENSORES
Semicondutores
Nanoprodução
Estrutura e simetria do cristal
Prorpriedades ópticas
Fotoiluminiscencia
Emissão
Silício poroso
AbstractDue to possible technological applications in opto-electronic devices, the interest in characterizing porous silicon structure patterns has recently increased. From scanning force microscopy (SFM) we have obtained images of different samples of porous silicon and applied pattern characterization operators on these matrices. Tn this paper, asymmetric spatial fragmentation in amplitude envelopes of porous silicon samples are characterized by means of a parameter that quantifies the amount of spatial asymmetry in the gradient field. The results show that this method is well suited to characterize silicon porosity quantitatively.
AreaFISMAT
Arrangementurlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAS > Characterization of asymmetric...
doc Directory Contentaccess
source Directory Contentthere are no files
agreement Directory Contentthere are no files
4. Conditions of access and use
Languageen
Target Filecharacterization asymmetric.pdf
User Groupadministrator
marciana
sergio
Visibilityshown
Copy HolderSID/SCD
Archiving Policydenypublisher denyfinaldraft24
Read Permissiondeny from all and allow from 150.163
5. Allied materials
Next Higher Units8JMKD3MGPCW/3ESR3H2
DisseminationWEBSCI; PORTALCAPES; COMPENDEX.
Host Collectionsid.inpe.br/banon/2003/08.15.17.40
6. Notes
Empty Fieldsalternatejournal archivist callnumber copyright creatorhistory descriptionlevel documentstage doi e-mailaddress format isbn label lineage mark mirrorrepository nextedition notes orcid parameterlist parentrepositories previousedition previouslowerunit progress readergroup rightsholder schedulinginformation secondarydate secondarymark session shorttitle sponsor subject tertiarymark tertiarytype typeofwork url versiontype
7. Description control
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