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1. Identity statement
Reference TypeJournal Article
Sitemtc-m16.sid.inpe.br
Holder Codeisadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S
Identifier6qtX3pFwXQZsFDuKxG/EAi37
Repositorysid.inpe.br/marciana/2004/12.27.09.49   (restricted access)
Last Update2005:07.01.03.00.00 (UTC) administrator
Metadata Repositorysid.inpe.br/marciana/2004/12.27.09.49.33
Metadata Last Update2018:06.05.01.21.19 (UTC) administrator
Secondary KeyINPE-11836-PRE/7183
ISSN0370-1972
Citation KeyVieiraNonoCruz:2002:NaThFi
TitleNanohardness of a Ti thin film and its interface deposited by an electron beam on a 304 SS substrate
ProjectTECAMB: Tecnologia ambiental
Year2002
MonthJuly
Access Date2024, Apr. 28
Secondary TypePRE PI
Number of Files1
Size146 KiB
2. Context
Author1 Vieira, Rogerio de Almeida
2 Nono, Maria do Carmo de Andrade
3 Cruz, N. C.
Resume Identifier1
2 8JMKD3MGP5W/3C9JHRC
Group1 LAS-INPE-MCT-BR
2 LAS-INPE-MCT-BR
Affiliation1 Instituto Nacional de Pequisas Espaciais, Laboratorio Associado de Sensores e Materiais, (INPE. LAS)
2 Instituto Nacional de Pequisas Espaciais, Laboratorio Associado de Sensores e Materiais, (INPE. LAS)
3 Universidade Estadual Paulista, Faculdade de Engenharia de Guaratinguetá, Departamento de Física e Química (UNESP.FEG)
JournalPhysica Status Solidi B: Basic Research
Volume232
Number1
Pages116-120
History (UTC)2005-07-01 11:34:37 :: sergio -> administrator ::
2007-04-04 21:00:28 :: administrator -> sergio ::
2008-01-07 12:53:52 :: sergio -> marciana ::
2008-03-14 13:07:49 :: marciana -> administrator ::
2008-06-10 22:28:49 :: administrator -> banon ::
2010-05-17 18:38:14 :: banon -> administrator ::
2018-06-05 01:21:19 :: administrator -> marciana :: 2002
3. Content and structure
Is the master or a copy?is the master
Content Stagecompleted
Transferable1
Content TypeExternal Contribution
KeywordsSENSORS AND MATERIALS
Thin films
Electron beam
SENSORES E MATERIAIS
Filmes
Elétrons
AbstractThe results of nanohardness measurements at a film surface and film-substrate interface are presented and discussed. An electron beam device was used to deposit a Ti film on a 304 stainless steel(304 SS)substrate. The diluted interface was obtained by thermal activated atomic diffusion. The. Ti film and Ti film-304 SS interface were analyzed by energy dispersive spectrometry and were observed using atomic force microscopy. The nanohardness of the Ti film-304 SS system was measured by a nanoindentation technique. The results showed the Ti film-304 SS interface had a higher hardness value than the Ti film and 304 SS substrate. The Ti film surface had a lower hardness due to the presence of a TiO2 thin layer.
AreaFISMAT
Arrangementurlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAS > Nanohardness of a...
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4. Conditions of access and use
Languageen
Target Filenanohardness.pdf
User Groupadministrator
banon
marciana
sergio
Visibilityshown
Copy HolderSID/SCD
Archiving Policydenypublisher denyfinaldraft
Read Permissiondeny from all and allow from 150.163
5. Allied materials
Next Higher Units8JMKD3MGPCW/3ESR3H2
DisseminationWEBSCI; PORTALCAPES.
Host Collectionsid.inpe.br/banon/2003/08.15.17.40
6. Notes
Empty Fieldsalternatejournal archivist callnumber copyright creatorhistory descriptionlevel documentstage doi e-mailaddress electronicmailaddress format isbn label lineage mark mirrorrepository nextedition notes orcid parameterlist parentrepositories previousedition previouslowerunit progress readergroup rightsholder schedulinginformation secondarydate secondarymark session shorttitle sponsor subject tertiarymark tertiarytype typeofwork url versiontype
7. Description control
e-Mail (login)marciana
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