1. Identity statement | |
Reference Type | Journal Article |
Site | mtc-m16.sid.inpe.br |
Holder Code | isadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S |
Identifier | 6qtX3pFwXQZsFDuKxG/EAi37 |
Repository | sid.inpe.br/marciana/2004/12.27.09.49 (restricted access) |
Last Update | 2005:07.01.03.00.00 (UTC) administrator |
Metadata Repository | sid.inpe.br/marciana/2004/12.27.09.49.33 |
Metadata Last Update | 2018:06.05.01.21.19 (UTC) administrator |
Secondary Key | INPE-11836-PRE/7183 |
ISSN | 0370-1972 |
Citation Key | VieiraNonoCruz:2002:NaThFi |
Title | Nanohardness of a Ti thin film and its interface deposited by an electron beam on a 304 SS substrate |
Project | TECAMB: Tecnologia ambiental |
Year | 2002 |
Month | July |
Access Date | 2024, Apr. 28 |
Secondary Type | PRE PI |
Number of Files | 1 |
Size | 146 KiB |
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2. Context | |
Author | 1 Vieira, Rogerio de Almeida 2 Nono, Maria do Carmo de Andrade 3 Cruz, N. C. |
Resume Identifier | 1 2 8JMKD3MGP5W/3C9JHRC |
Group | 1 LAS-INPE-MCT-BR 2 LAS-INPE-MCT-BR |
Affiliation | 1 Instituto Nacional de Pequisas Espaciais, Laboratorio Associado de Sensores e Materiais, (INPE. LAS) 2 Instituto Nacional de Pequisas Espaciais, Laboratorio Associado de Sensores e Materiais, (INPE. LAS) 3 Universidade Estadual Paulista, Faculdade de Engenharia de Guaratinguetá, Departamento de Física e Química (UNESP.FEG) |
Journal | Physica Status Solidi B: Basic Research |
Volume | 232 |
Number | 1 |
Pages | 116-120 |
History (UTC) | 2005-07-01 11:34:37 :: sergio -> administrator :: 2007-04-04 21:00:28 :: administrator -> sergio :: 2008-01-07 12:53:52 :: sergio -> marciana :: 2008-03-14 13:07:49 :: marciana -> administrator :: 2008-06-10 22:28:49 :: administrator -> banon :: 2010-05-17 18:38:14 :: banon -> administrator :: 2018-06-05 01:21:19 :: administrator -> marciana :: 2002 |
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3. Content and structure | |
Is the master or a copy? | is the master |
Content Stage | completed |
Transferable | 1 |
Content Type | External Contribution |
Keywords | SENSORS AND MATERIALS Thin films Electron beam SENSORES E MATERIAIS Filmes Elétrons |
Abstract | The results of nanohardness measurements at a film surface and film-substrate interface are presented and discussed. An electron beam device was used to deposit a Ti film on a 304 stainless steel(304 SS)substrate. The diluted interface was obtained by thermal activated atomic diffusion. The. Ti film and Ti film-304 SS interface were analyzed by energy dispersive spectrometry and were observed using atomic force microscopy. The nanohardness of the Ti film-304 SS system was measured by a nanoindentation technique. The results showed the Ti film-304 SS interface had a higher hardness value than the Ti film and 304 SS substrate. The Ti film surface had a lower hardness due to the presence of a TiO2 thin layer. |
Area | FISMAT |
Arrangement | urlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAS > Nanohardness of a... |
doc Directory Content | access |
source Directory Content | there are no files |
agreement Directory Content | there are no files |
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4. Conditions of access and use | |
Language | en |
Target File | nanohardness.pdf |
User Group | administrator banon marciana sergio |
Visibility | shown |
Copy Holder | SID/SCD |
Archiving Policy | denypublisher denyfinaldraft |
Read Permission | deny from all and allow from 150.163 |
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5. Allied materials | |
Next Higher Units | 8JMKD3MGPCW/3ESR3H2 |
Dissemination | WEBSCI; PORTALCAPES. |
Host Collection | sid.inpe.br/banon/2003/08.15.17.40 |
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6. Notes | |
Empty Fields | alternatejournal archivist callnumber copyright creatorhistory descriptionlevel documentstage doi e-mailaddress electronicmailaddress format isbn label lineage mark mirrorrepository nextedition notes orcid parameterlist parentrepositories previousedition previouslowerunit progress readergroup rightsholder schedulinginformation secondarydate secondarymark session shorttitle sponsor subject tertiarymark tertiarytype typeofwork url versiontype |
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7. Description control | |
e-Mail (login) | marciana |
update | |
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