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1. Identity statement
Reference TypeJournal Article
Sitemtc-m16.sid.inpe.br
Holder Codeisadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S
Identifier6qtX3pFwXQZsFDuKxG/FaMLd
Repositorysid.inpe.br/marciana/2005/02.14.14.13   (restricted access)
Last Update2005:02.14.02.00.00 (UTC) administrator
Metadata Repositorysid.inpe.br/marciana/2005/02.14.14.13.52
Metadata Last Update2018:06.05.01.28.49 (UTC) administrator
Secondary KeyINPE-12165-PRE/7505
ISSN0038-1101
Citation KeyVeissidBonnRich:1995:CoInUn
TitleExperimental investigation of the double exponential model of a solar cell under illuminated conditions: Considering the instrumental uncertainties in the current, voltage and temperature values
ProjectCELSOL: Células solares
Year1995
MonthNov.
Access Date2024, Apr. 28
Secondary TypePRE PI
Number of Files1
Size693 KiB
2. Context
Author1 Veissid, N.
2 Bonnet, D
3 Richter, H
Group1 LAS-INPE-MCT-BR
Affiliation1 Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
2 ANTEC GmbH
3 ANTEC GmbH
JournalSolid State Electronics
Volume38
Number11
Pages1937-1943
History (UTC)2005-02-14 16:13:53 :: sergio -> administrator ::
2007-04-04 23:56:49 :: administrator -> sergio ::
2008-01-07 12:50:04 :: sergio -> marciana ::
2008-02-21 16:16:52 :: marciana -> administrator ::
2018-06-05 01:28:49 :: administrator -> marciana :: 1995
3. Content and structure
Is the master or a copy?is the master
Content Stagecompleted
Transferable1
Content TypeExternal Contribution
KeywordsMATERIALS PHYSICS
Solar cell
Standard deviation
FÍSICA DE MATERIAIS
Células solares
Desvio padrão
AbstractIn this paper is presented a new approach for determining the current standard deviation which is used in the current-voltage characteristic fitting. The analytical equation has been deduced from propagation of errors theory and it takes into account measurement uncertainties in the current, voltage and temperature values. A conventional monocrystalline silicon solar cell sample has been used to test the theory. We measured several I-V curves under illuminated condition with the temperature varying in the range between −75 and 75°C. We have adopted the chi-square minimization as the error criterion for fitting the experimental curves using the standard deviation proposed in this work. The main advantage of the proposed formalism is that it leads to an improved chi-square value, i.e value physically and statistically more acceptable. We obtain best values for the standard deviation of the parameters from a fitting procedure using the double exponential model. The results show that for a measurement uncertainty of 0.5°C in the temperature, the uncertainty in the current around the open circuit is of about 5% of the short circuit current. Consequently, we conclude that a carefully controlled temperature during measurement is an essential condition for obtaining reliable experimental I-V curves. Tables and figures show the fitted double exponential parameters fitted as a function of temperature, as well as their standard deviations.
AreaFISMAT
Arrangementurlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAS > Experimental investigation of...
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4. Conditions of access and use
Languageen
Target Fileexperimental veissid.pdf
User Groupadministrator
marciana
sergio
Visibilityshown
Copy HolderSID/SCD
Archiving Policydenypublisher denyfinaldraft24
Read Permissiondeny from all and allow from 150.163
5. Allied materials
Next Higher Units8JMKD3MGPCW/3ESR3H2
DisseminationWEBSCI; PORTALCAPES.
Host Collectionsid.inpe.br/banon/2003/08.15.17.40
6. Notes
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7. Description control
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