| 1. Identity statement | |
| Reference Type | Journal Article |
| Site | mtc-m16.sid.inpe.br |
| Holder Code | isadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S |
| Identifier | 6qtX3pFwXQZGivnJVY/M3jbb |
| Repository | sid.inpe.br/mtc-m16@80/2006/08.03.13.58 (restricted access) |
| Last Update | 2006:11.23.11.04.23 (UTC) administrator |
| Metadata Repository | sid.inpe.br/mtc-m16@80/2006/08.03.13.58.58 |
| Metadata Last Update | 2018:06.05.01.16.56 (UTC) administrator |
| Secondary Key | INPE-14333-PRE/9420 |
| ISSN | 0103-9733 |
| Citation Key | MenguiAbraRappUeta:2006:ChSnFi |
| Title | Characterization of SnTe films grown by molecular beam epitaxy  |
| Year | 2006 |
| Month | June |
| Access Date | 2024, Apr. 28 |
| Secondary Type | PRE PN |
| Number of Files | 1 |
| Size | 355 KiB |
| 2. Context | |
| Author | 1 Mengui, Úrsula Andréia 2 Abramof, Eduardo 3 Rappl, Paulo Henrique de Oliveira 4 Ueta, Antonio Yukio |
| Resume Identifier | 1 2 8JMKD3MGP5W/3C9JGUH 3 8JMKD3MGP5W/3C9JJ37 |
| Group | 1 LAS-INPE-MCT-BR 2 LAS-INPE-MCT-BR 3 LAS-INPE-MCT-BR 4 LAS-INPE-MCT-BR |
| Affiliation | 1 Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS) 2 Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS) 3 Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS) 4 Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS) |
| Journal | Brazilian Journal of Physics |
| Volume | 36 |
| Number | 2A |
| Pages | 324-327 |
| History (UTC) | 2006-08-03 13:58:58 :: simone -> administrator :: 2006-09-28 22:33:38 :: administrator -> simone :: 2006-11-23 11:04:23 :: simone -> administrator :: 2018-06-05 01:16:56 :: administrator -> marciana :: 2006 |
| 3. Content and structure | |
| Is the master or a copy? | is the master |
| Content Stage | completed |
| Transferable | 1 |
| Content Type | External Contribution |
| Keywords | SnTe molecular beam epitaxy BaF2 substrates TIN TELLURIDE SPIRAL GROWTH SI(111) PBSE PBTE |
| Abstract | A series of SnTe layers with thicknesses varying from 0.42 to 9.1 mu m were grown by molecular beam epitaxy on (111) BaF2 substrates. The SnTe lattice parameter was found to be 6.331 angstrom as determined from x-ray diffraction spectra measured in the triple-axis configuration. The FWHM of the (222) SnTe x-ray rocking curves indicated a good crystalline quality and an unusual dependence on layer thickness. Atomic force microscopy (AFM) of the SnTe surface revealed spirals with monolayer steps formed around threading dislocations, similar to the PbTe on BaF2 epitaxy.. The dislocation density was estimated from the AFM picture to be 9AC cm(-2). Small black pits corresponding to holes that were left during growth were also observed on the AFM images. Sri diffusion can be a possible reason for these pits and the relatively high dislocation density. Electrical measurements showed that the SnTe epilayers present a typical p-type carrier concentration around 10(20) cm(-3), almost temperature independent and a Hall mobility which decreases from 10(4) to 10(3) cm(2)/V.s as the temperature increases from 10 to 350K. |
| Area | FISMAT |
| Arrangement | urlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAS > Characterization of SnTe... |
| doc Directory Content | access |
| source Directory Content | there are no files |
| agreement Directory Content | there are no files |
| 4. Conditions of access and use | |
| Language | en |
| Target File | Characterization of SnTe films.pdf |
| User Group | administrator simone |
| Visibility | shown |
| Copy Holder | SID/SCD |
| Archiving Policy | denypublisher denyfinaldraft12 |
| Read Permission | deny from all and allow from 150.163 |
| 5. Allied materials | |
| Next Higher Units | 8JMKD3MGPCW/3ESR3H2 |
| Dissemination | WEBSCI; PORTALCAPES; SCIELO. |
| Host Collection | sid.inpe.br/banon/2003/08.15.17.40 |
| 6. Notes | |
| Empty Fields | alternatejournal archivist callnumber copyright creatorhistory descriptionlevel documentstage doi e-mailaddress electronicmailaddress format isbn label lineage mark mirrorrepository nextedition notes orcid parameterlist parentrepositories previousedition previouslowerunit progress project readergroup rightsholder schedulinginformation secondarydate secondarymark session shorttitle sponsor subject tertiarymark tertiarytype typeofwork url versiontype |
| 7. Description control | |
| e-Mail (login) | marciana |
| update | |