| 1. Identity statement | |
| Reference Type | Journal Article |
| Site | mtc-m16b.sid.inpe.br |
| Holder Code | isadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S |
| Identifier | 6qtX3pFwXQZGivnK2Y/SnJHK |
| Repository | sid.inpe.br/mtc-m17@80/2007/12.06.17.54 (restricted access) |
| Last Update | 2008:06.18.12.15.54 (UTC) administrator |
| Metadata Repository | sid.inpe.br/mtc-m17@80/2007/12.06.17.54.32 |
| Metadata Last Update | 2018:06.05.03.30.28 (UTC) administrator |
| Secondary Key | INPE--PRE/ |
| DOI | 10.1016/j.jallcom.2007.04.039 |
| ISSN | 0925-8388 |
| Citation Key | AmseiJrSiPiZaLoVa:2008:StElPr |
| Title | Structural and electrical properties of SrBi2(Ta0.5Nb0.5)2O9 thin films  |
| Year | 2008 |
| Month | June |
| Access Date | 2024, Apr. 27 |
| Secondary Type | PRE PI |
| Number of Files | 1 |
| Size | 400 KiB |
| 2. Context | |
| Author | 1 Amsei Junior, N. L. 2 Simões, A. Z. 3 Pianno, R. F. C. 4 Zanetti, Sonia Maria 5 Longo, E. 6 Varela, J. A. |
| Group | 1 2 3 4 LAS-CTE-INPE-MCT-BR |
| Affiliation | 1 Instituto de Química, Universidade Estadual Paulista (UNESP) 2 Instituto de Química, Universidade Estadual Paulista (UNESP) 3 Instituto de Química, Universidade Estadual Paulista (UNESP) 4 Instituto Nacional de Pesquisas Espaciais (INPE) 5 Instituto de Química, Universidade Estadual Paulista (UNESP) 6 Instituto de Química, Universidade Estadual Paulista (UNESP) |
| Journal | Journal of Alloys and Compounds |
| Volume | 458 |
| Number | 1/2 |
| Pages | 500-503 |
| History (UTC) | 2008-06-18 12:15:54 :: simone -> administrator :: 2008-06-29 02:38:45 :: administrator -> banon :: 2008-11-05 18:40:22 :: banon -> administrator :: 2012-10-20 15:07:52 :: administrator -> simone :: 2008 2013-02-20 15:20:12 :: simone -> administrator :: 2008 2018-06-05 03:30:28 :: administrator -> marciana :: 2008 |
| 3. Content and structure | |
| Is the master or a copy? | is the master |
| Content Stage | completed |
| Transferable | 1 |
| Content Type | External Contribution |
| Keywords | Ferroelectric Chemical synthesis Thin films Nanostructures |
| Abstract | SrBi2(Ta0.5Nb0.5)2O9 (SBTN) thin films were obtained by polymeric precursor method on Pt/Ti/SiO2/Si(1 0 0) substrates. The film is dense and crack-free after annealing at 700 °C for 2 h in static air. Crystallinity and morphological characteristic were examined by X-ray diffraction (XRD), field emission scanning electron microscopy (FEG-SEM) and atomic force microscopy (AFM). The films displayed rounded grains with a superficial roughness of 3.5 nm. The dielectric permittivity was 122 with loss tangent of 0.040. The remanent polarization (Pr) and coercive field (Ec) were 5.1 ìC/cm2 and 96 kV/cm, respectively. |
| Area | FISMAT |
| Arrangement | urlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAS > Structural and electrical... |
| doc Directory Content | access |
| source Directory Content | there are no files |
| agreement Directory Content | there are no files |
| 4. Conditions of access and use | |
| Language | en |
| Target File | structural and electrical.pdf |
| User Group | administrator banon simone |
| Visibility | shown |
| Archiving Policy | denypublisher denyfinaldraft24 |
| Read Permission | deny from all and allow from 150.163 |
| 5. Allied materials | |
| Next Higher Units | 8JMKD3MGPCW/3ESR3H2 |
| Dissemination | WEBSCI; PORTALCAPES. |
| Host Collection | lcp.inpe.br/ignes/2004/02.12.18.39 cptec.inpe.br/walmeida/2003/04.25.17.12 |
| 6. Notes | |
| Empty Fields | alternatejournal archivist callnumber copyholder copyright creatorhistory descriptionlevel documentstage e-mailaddress electronicmailaddress format isbn label lineage mark mirrorrepository nextedition notes orcid parameterlist parentrepositories previousedition previouslowerunit progress project readergroup resumeid rightsholder schedulinginformation secondarydate secondarymark session shorttitle sponsor subject tertiarymark tertiarytype typeofwork url versiontype |
| 7. Description control | |
| e-Mail (login) | marciana |
| update | |