1. Identity statement | |
Reference Type | Journal Article |
Site | mtc-m16.sid.inpe.br |
Holder Code | isadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S |
Identifier | 6qtX3pFwXQZGivnJVY/LwRGs |
Repository | sid.inpe.br/mtc-m16@80/2006/06.22.12.44 (restricted access) |
Last Update | 2006:06.22.12.44.50 (UTC) administrator |
Metadata Repository | sid.inpe.br/mtc-m16@80/2006/06.22.12.44.52 |
Metadata Last Update | 2018:06.05.01.16.51 (UTC) administrator |
Secondary Key | INPE-13802--PRE/8988 |
ISSN | 0026-2692 |
Citation Key | BaroniRSPRRAPV:2006:MoGrPa |
Title | Modeling and gradient pattern analysis of irregular SFM structures of porous silicon |
Year | 2006 |
Month | Apr. |
Access Date | 2024, May 02 |
Secondary Type | PRE PI |
Number of Files | 1 |
Size | 353 KiB |
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2. Context | |
Author | 1 Baroni, M. P. M. A. 2 Rosa, Reinaldo Roberto 3 Silva, A. Ferreira 4 Pepe, I. 5 Roman, L. S. 6 Ramos, Fernando Manuel 7 Ahuja, R. 8 Persson, C. 9 Veje, E. |
Resume Identifier | 1 2 8JMKD3MGP5W/3C9JJ5D 3 4 5 6 8JMKD3MGP5W/3C9JH4A |
Group | 1 LAC-INPE-MCT-BR 2 LAC-INPE-MCT-BR 3 LAC-INPE-MCT-BR |
Affiliation | 1 Instituto Nacional de Pesquisas Espaciais, Laboratorio Associado de Computação e Matemática Aplicada (INPE.LAC) 2 Instituto Nacional de Pesquisas Espaciais, Laboratorio Associado de Computação e Matemática Aplicada (INPE.LAC) 3 Grupo de Fisica Basica e Aplicada em Materiais Semicondutores, Laboratorio de Propriedades Opticas, Instituto de Fisica, Universidade Federal da Bahia 4 Grupo de Fisica Basica e Aplicada em Materiais Semicondutores, Laboratorio de Propriedades Opticas, Instituto de Fisica, Universidade Federal da Bahia 5 Grupo de Dispositivos Nanoestruturados, Departamento de Física, Universidade Federal do Paraná 6 Instituto Nacional de Pesquisas Espaciais, Laboratorio Associado de Computação e Matemática Aplicada (INPE.LAC) 7 Department of Physics, Condensed Matter Theory Group, Uppsala University 8 Applied Materials Physics, Department of Materials Science and Engineering, Royal Institute of Technology 9 Grupo de Fisica Basica e Aplicada em Materiais Semicondutores, Laboratorio de Propriedades Opticas, Instituto de Fisica, Universidade Federal da Bahia |
Journal | Microelectronics Journal |
Volume | 37 |
Number | 4 |
Pages | 290-294 |
History (UTC) | 2006-06-22 12:44:52 :: simone -> administrator :: 2018-06-05 01:16:51 :: administrator -> marciana :: 2006 |
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3. Content and structure | |
Is the master or a copy? | is the master |
Content Stage | completed |
Transferable | 1 |
Content Type | External Contribution |
Keywords | porous silicon KPZ equation gradient pattern analysis nanostructures ASYMMETRIC FRAGMENTATION PATTERNS DYNAMICS |
Abstract | Technological applications in opto-electronic devices have increased the interest in characterizing porous silicon structure patterns. Due to its physical properties, solutions from KPZ 2D are adopted to simulate the structure of porous material interface whose spatial characteristics are equivalent to those found in porous silicon samples. The analysis of the simulated and real scanning Force Microscopy (SFM) surfaces was done using the Gradient Pattern Analysis (GPA). We found that the KPZ 2D model presented asymmetry levels compatible with the irregular surfaces observed by means of SFM images of pi-Si. |
Area | COMP |
Arrangement | urlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAC > Modeling and gradient... |
doc Directory Content | access |
source Directory Content | there are no files |
agreement Directory Content | there are no files |
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4. Conditions of access and use | |
Language | en |
Target File | Modeling and gradient pattern analysis of irregular.pdf |
User Group | administrator simone |
Visibility | shown |
Copy Holder | SID/SCD |
Archiving Policy | denypublisher denyfinaldraft24 |
Read Permission | deny from all and allow from 150.163 |
Update Permission | transferred to simone |
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5. Allied materials | |
Next Higher Units | 8JMKD3MGPCW/3ESGTTP |
Dissemination | WEBSCI |
Host Collection | sid.inpe.br/banon/2003/08.15.17.40 |
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6. Notes | |
Empty Fields | alternatejournal archivist callnumber copyright creatorhistory descriptionlevel doi e-mailaddress electronicmailaddress format isbn label lineage mark mirrorrepository nextedition notes orcid parameterlist parentrepositories previousedition previouslowerunit progress project readergroup rightsholder schedulinginformation secondarydate secondarymark session shorttitle sponsor subject tertiarymark tertiarytype typeofwork url versiontype |
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7. Description control | |
e-Mail (login) | marciana |
update | |
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