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1. Identity statement
Reference TypeJournal Article
Sitemtc-m16.sid.inpe.br
Holder Codeisadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S
Identifier6qtX3pFwXQZGivnJVY/LwRGs
Repositorysid.inpe.br/mtc-m16@80/2006/06.22.12.44   (restricted access)
Last Update2006:06.22.12.44.50 (UTC) administrator
Metadata Repositorysid.inpe.br/mtc-m16@80/2006/06.22.12.44.52
Metadata Last Update2018:06.05.01.16.51 (UTC) administrator
Secondary KeyINPE-13802--PRE/8988
ISSN0026-2692
Citation KeyBaroniRSPRRAPV:2006:MoGrPa
TitleModeling and gradient pattern analysis of irregular SFM structures of porous silicon
Year2006
MonthApr.
Access Date2024, May 02
Secondary TypePRE PI
Number of Files1
Size353 KiB
2. Context
Author1 Baroni, M. P. M. A.
2 Rosa, Reinaldo Roberto
3 Silva, A. Ferreira
4 Pepe, I.
5 Roman, L. S.
6 Ramos, Fernando Manuel
7 Ahuja, R.
8 Persson, C.
9 Veje, E.
Resume Identifier1
2 8JMKD3MGP5W/3C9JJ5D
3
4
5
6 8JMKD3MGP5W/3C9JH4A
Group1 LAC-INPE-MCT-BR
2 LAC-INPE-MCT-BR
3 LAC-INPE-MCT-BR
Affiliation1 Instituto Nacional de Pesquisas Espaciais, Laboratorio Associado de Computação e Matemática Aplicada (INPE.LAC)
2 Instituto Nacional de Pesquisas Espaciais, Laboratorio Associado de Computação e Matemática Aplicada (INPE.LAC)
3 Grupo de Fisica Basica e Aplicada em Materiais Semicondutores, Laboratorio de Propriedades Opticas, Instituto de Fisica, Universidade Federal da Bahia
4 Grupo de Fisica Basica e Aplicada em Materiais Semicondutores, Laboratorio de Propriedades Opticas, Instituto de Fisica, Universidade Federal da Bahia
5 Grupo de Dispositivos Nanoestruturados, Departamento de Física, Universidade Federal do Paraná
6 Instituto Nacional de Pesquisas Espaciais, Laboratorio Associado de Computação e Matemática Aplicada (INPE.LAC)
7 Department of Physics, Condensed Matter Theory Group, Uppsala University
8 Applied Materials Physics, Department of Materials Science and Engineering, Royal Institute of Technology
9 Grupo de Fisica Basica e Aplicada em Materiais Semicondutores, Laboratorio de Propriedades Opticas, Instituto de Fisica, Universidade Federal da Bahia
JournalMicroelectronics Journal
Volume37
Number4
Pages290-294
History (UTC)2006-06-22 12:44:52 :: simone -> administrator ::
2018-06-05 01:16:51 :: administrator -> marciana :: 2006
3. Content and structure
Is the master or a copy?is the master
Content Stagecompleted
Transferable1
Content TypeExternal Contribution
Keywordsporous silicon
KPZ equation
gradient pattern analysis
nanostructures
ASYMMETRIC FRAGMENTATION PATTERNS
DYNAMICS
AbstractTechnological applications in opto-electronic devices have increased the interest in characterizing porous silicon structure patterns. Due to its physical properties, solutions from KPZ 2D are adopted to simulate the structure of porous material interface whose spatial characteristics are equivalent to those found in porous silicon samples. The analysis of the simulated and real scanning Force Microscopy (SFM) surfaces was done using the Gradient Pattern Analysis (GPA). We found that the KPZ 2D model presented asymmetry levels compatible with the irregular surfaces observed by means of SFM images of pi-Si.
AreaCOMP
Arrangementurlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAC > Modeling and gradient...
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4. Conditions of access and use
Languageen
Target FileModeling and gradient pattern analysis of irregular.pdf
User Groupadministrator
simone
Visibilityshown
Copy HolderSID/SCD
Archiving Policydenypublisher denyfinaldraft24
Read Permissiondeny from all and allow from 150.163
Update Permissiontransferred to simone
5. Allied materials
Next Higher Units8JMKD3MGPCW/3ESGTTP
DisseminationWEBSCI
Host Collectionsid.inpe.br/banon/2003/08.15.17.40
6. Notes
Empty Fieldsalternatejournal archivist callnumber copyright creatorhistory descriptionlevel doi e-mailaddress electronicmailaddress format isbn label lineage mark mirrorrepository nextedition notes orcid parameterlist parentrepositories previousedition previouslowerunit progress project readergroup rightsholder schedulinginformation secondarydate secondarymark session shorttitle sponsor subject tertiarymark tertiarytype typeofwork url versiontype
7. Description control
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