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1. Identity statement
Reference TypeJournal Article
Sitemtc-m16b.sid.inpe.br
Holder Codeisadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S
Identifier6qtX3pFwXQZGivnK2Y/S9pT6
Repositorysid.inpe.br/mtc-m17@80/2007/11.13.17.36   (restricted access)
Last Update2007:11.13.17.36.15 (UTC) administrator
Metadata Repositorysid.inpe.br/mtc-m17@80/2007/11.13.17.36.16
Metadata Last Update2018:06.05.03.35.03 (UTC) administrator
Secondary KeyINPE-14909-PRE/9823
ISSN0102-6895
Citation KeyRibeiroSueOliFerMot:2007:LoTeGr
TitleLow temperature growth of high quality CdTe polycrystalline layers
Year2007
MonthAug.
Access Date2024, May 01
Secondary TypePRE PN
Number of Files1
Size867 KiB
2. Context
Author1 Ribeiro, I. R. B.
2 Suela, J.
3 Oliveira, J. E.
4 Ferreira, S. O.
5 Motisuke, Paulo
Resume Identifier1
2
3
4
5 8JMKD3MGP5W/3C9JJ39
Group1
2
3
4
5 LAS-INPE-MCT-BR
Affiliation1 Departamento de Física. Universidade Federal de Viçosa (UFV)
2 Departamento de Física. Universidade Federal de Viçosa (UFV)
3 Departamento de Física. Universidade Federal de Viçosa (UFV)
4 Departamento de Física. Universidade Federal de Viçosa (UFV)
5 Instituto Nacional de Pesquisas Espaciais (INPE)
JournalRevista de Física Aplicada e Instrumentação
Volume40
Number15
Pages4610-4613
History (UTC)2007-11-13 17:36:16 :: simone -> administrator ::
2008-06-29 02:37:05 :: administrator -> banon ::
2010-05-12 14:13:44 :: banon -> administrator ::
2012-10-23 23:59:00 :: administrator -> simone :: 2007
2013-02-20 15:20:02 :: simone -> administrator :: 2007
2018-06-05 03:35:03 :: administrator -> marciana :: 2007
3. Content and structure
Is the master or a copy?is the master
Content Stagecompleted
Transferable1
Content TypeExternal Contribution
KeywordsHOT-WALL EPITAXY
THIN-FILMS
SOLAR-CELLS
ROUGHNESS
BEHAVIOR
SI(111)
AbstractWe have investigated the growth of CdTe thin films on glass substrates by hot wall epitaxy. The layers have been characterized by scanning electron microscopy, atomic force microscopy, profilometry, x-ray diffraction and optical transmission. The grown samples are polycrystalline with a high preferential [111] orientation. Atomic force microscopy and scanning electron microscopy reveal pyramidal grain shapes with a size of around 0.3 mu m. The surface roughness increases with sample thickness and growth temperature, reaching about 200 nm for 10 mu m thick layers grown at 300 degrees C. Samples with a thickness of 2 mu m grown at 150 degrees C showed a roughness of less than 40 nm. Optical transmission measurements demonstrate layers with high optical quality.
AreaFISMAT
Arrangementurlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAS > Low temperature growth...
doc Directory Contentaccess
source Directory Contentthere are no files
agreement Directory Contentthere are no files
4. Conditions of access and use
Languageen
Target Filelow temperature growth of high.pdf
User Groupadministrator
banon
simone
Visibilityshown
Copy HolderSID/SCD
Archiving Policydenypublisher denyfinaldraft
Read Permissiondeny from all and allow from 150.163
5. Allied materials
Next Higher Units8JMKD3MGPCW/3ESR3H2
DisseminationPORTALCAPES
Host Collectionlcp.inpe.br/ignes/2004/02.12.18.39
cptec.inpe.br/walmeida/2003/04.25.17.12
6. Notes
Empty Fieldsalternatejournal archivist callnumber copyright creatorhistory descriptionlevel documentstage doi e-mailaddress electronicmailaddress format isbn label lineage mark mirrorrepository nextedition notes orcid parameterlist parentrepositories previousedition previouslowerunit progress project readergroup rightsholder schedulinginformation secondarydate secondarymark session shorttitle sponsor subject tertiarymark tertiarytype typeofwork url versiontype
7. Description control
e-Mail (login)marciana
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